MBIST Algorithm - Testing algorithm

MBIST 有許多測試算法, 針對不同製程及不同缺陷產生. 會有不同的運算測試方法. 我們建議如下,

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for Emerging Market

Technology node	Testing algorithm	Memory defect
180nm/130nm/110nm/90nm	March C-, March C, March C+	SAF, TF, AF, CFin, CFid, CFst
55nm/40nm	March C-, March C, March C+, March LR, MOVI	SAF, TF, AF, CFin, CFid, CFst, SOF, RDF
28nm/16nm/12nm	March 33N, CROWN	SAF, TF, AF, CFin, CFid, CFst, SOF, RDF, dRDF, dIRF, dDRDF, dTF, dWDF
7nm/5nm/3nm	POLARIS	SAF, TF, AF, CFin, CFid, CFst, SOF, RDF, dRDF, dIRF, dDRDF, dTF, dWDF, Word-oriented CF

 

Specific request	Testing algorithm
Retention test	March RET, March MDSN
Memory with write enable	Non-March BM
Dedicated test column or row	Fast_X, Fast_Y
Automotive electronics	ECC

 for Emerging Market

Application	Technology node	Suggested algorithm
AI (Video)	40nm, 28nm, 16nm, 12nm, 7nm, 5nm, 3nm	March 33N, CROWN, POLARIS
AI (Audio)	55nm, 40nm, 28nm	March C+, March C, March 33N
AI (Blockchain)	28nm, 16nm12nm, 7nm, 5nm, 3nm	March 33N, CROWN, POLARIS
Security	55nm, 40nm, 28nm	MOVI, March C+, Non-March BM, March MDSN, March 33N
Wireless (WiFi or BLE)	55nm, 40nm, 28nm	March C+, Non-March BM, March RET
Audio	55nm, 40nm, 28nm	MOVI, March C+, March C, Non-March BM, March RET, March 33N
TCON	55nm, 40nm, 28nm	MOVI, March C+, March 33N
Fingerprint recognition	180nm, 130nm, 110nm, 55nm, 28nm	MOVI, March C+, March C, Non-March BM, March RET, March 33N

for Programming type

Programming Type	Suggested algorithm
Most of instructions are related to Load/Store	March C+, March 33N, CROWN, POLARIS
Most of instructions are related to Branch	MOVI, March C+, March C
Most of instructions are related to VLIW and SIMD	March C+, March 33N, CROWN, POLARIS
Most of instructions are related to ALU	MOVI, March C+, Non-March BM, March MDSN, March 33N

for Automotive

Suggested algorithm	Note
March CW	The March CW algorithm is a word-oriented test algorithm for embedded memory. It has highest fault coverage than other algorithms.
March 33N	The March 33N minimal March test algorithm is introduced for detection of all two-operation single-cell dynamic faults.
Non-March BM	The Non-March BM is used to detect bit/group write enable faults and datapath shorts.

Suggested algorithm	Note
March Weak WL @2P	The March Weak WL @2P for two port memories in advance manufacturing technologies
March C+ @2P	The March C+ @2P algorithm detects normally memory fault in two ports memory
March A2PF-M	The March A2PF-M algorithm for dual port memories in advance manufacturing technologies
March C+ @DP	The March C+ @DP algorithm detects normally memory fault in dual port memory

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